In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...
Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Alpha Software (781-229-4500) has introduced manufacturing quality solutions built on its Alpha TransForm no‑code platform to ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
The founding team of CEO Sophia Millar, Chief Technical Officer George Hallo, and Chief Product Officer Hooman Piroux ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
In industry, the detection of anomalies such as scratches, dents, and discolorations is crucial to ensure product quality and safety. However, conventional methods rely on heavy computational ...